Paper
12 April 2005 Reactive magnetron sputtering of antinomy tin oxide films on glass substrate
Chien-Cheng Liu, Wei-Chi Huang, Fei-Lung Lu, Chien-Tang Wang
Author Affiliations +
Proceedings Volume 5852, Third International Conference on Experimental Mechanics and Third Conference of the Asian Committee on Experimental Mechanics; (2005) https://doi.org/10.1117/12.621512
Event: Third International Conference on Experimental Mechanics and Third Conference of the Asian Committee on Experimental Mechanics, 2004, -, Singapore
Abstract
Antinomy tin oxide (ATO) films have been widely used as a transparent conducting thin film material for application in various fields such as solar cells, opto-electronic devices, and liquid crystal displays. It has a high carrier concentration, low electrical resistivity and high transmission in the visible light range. ATO films were deposited on corning glass 1737F by low temperature reactive magnetron sputtering. The structural and surface properties of the films were determined with scanning electron microscopy, transmission electron microscopy, X-ray diffraction and atomic force microscopy. The effects of annealing temperature and atmosphere on the composition, microstructure, surface morphology, conductivity and optical properties of ATO films were investigated.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Chien-Cheng Liu, Wei-Chi Huang, Fei-Lung Lu, and Chien-Tang Wang "Reactive magnetron sputtering of antinomy tin oxide films on glass substrate", Proc. SPIE 5852, Third International Conference on Experimental Mechanics and Third Conference of the Asian Committee on Experimental Mechanics, (12 April 2005); https://doi.org/10.1117/12.621512
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KEYWORDS
Oxygen

Sputter deposition

Glasses

Oxides

Tin

Scanning electron microscopy

Surface roughness

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