Paper
13 June 2005 Confocal micro-optical distance sensor: realization and results
Author Affiliations +
Abstract
In this paper, the realization and characterization of a microoptical sensor using the chromatic confocal principle is presented. The sensor head is designed for distance gauging applications in high aspect ratio cavities with a diameter of about 2 mm. The first part of this paper focuses on the design and fabrication process of the hybrid optical benches, which combines refractive and diffractive micro optical components. Very tight tolerances of the optical path are required for the functionality of the sensor. Therefore the alignment structures and mounts between the different optical elements are produced from PMMA using deep X-ray lithography, the first step of the LIGA process. In the second part of this paper the characterization of first prototypes using different light sources are described and results presented.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Peter Lucke, Arndt Last, Jurgen Mohr, Aiko K. Ruprecht, Christof Pruss, Hans J. Tiziani, Wolfgang Osten, Peter Lehmann, and Sven Schonfelder "Confocal micro-optical distance sensor: realization and results", Proc. SPIE 5856, Optical Measurement Systems for Industrial Inspection IV, (13 June 2005); https://doi.org/10.1117/12.612418
Lens.org Logo
CITATIONS
Cited by 2 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Sensors

Confocal microscopy

Head

Light sources

Signal detection

Diffractive optical elements

Colorimetry

RELATED CONTENT

Optical fiber head optimized for colorimetry applications
Proceedings of SPIE (September 24 2005)
Chromatic confocal spectral interferometry (CCSI)
Proceedings of SPIE (August 14 2006)
Diffractive optics for data storage
Proceedings of SPIE (May 12 1995)
Confocal micro-optical distance sensor for precision metrology
Proceedings of SPIE (September 01 2004)

Back to Top