Paper
30 August 2005 New methods for calibrating systematic errors in interferometric measurements
Author Affiliations +
Abstract
Interferometers are often used to measure optical surfaces and systems. The accuracy of such measurements is often limited by the ability to calibrate systematic errors such as reference wave and image distortion. Standard techniques for calibrating reference wave include the two-sphere and random-ball test. QED Technologies® (QED) recently introduced a Subaperture Stitching Interferometer (SSI®) that has the integrated ability to perform reference wave calibration. By measuring an optical surface in multiple locations, the stitching algorithm has the ability to compensate for reference wave and imaging distortion. Each of the three reference wave calibration methods has its own limitations that ultimately affect the accuracy of the measurement. The merits of each technique for reference wave calibration are reviewed and analyzed. By using the SSI-computed estimate and the random-ball test in tandem, a composite method for calibrating reference wave error is shown to combine the benefits of both individual techniques. The stitching process also calibrates for distortion, and plots are shown for different transmission optics. Measurements with and without distortion compensation are shown, and the residual difference is compared to theoretical predictions.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
S. O'Donohue, G. Devries, P. Murphy, G. Forbes, and P. Dumas "New methods for calibrating systematic errors in interferometric measurements", Proc. SPIE 5869, Optical Manufacturing and Testing VI, 58690T (30 August 2005); https://doi.org/10.1117/12.617699
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CITATIONS
Cited by 3 scholarly publications.
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KEYWORDS
Calibration

Distortion

Optical spheres

Interferometers

Interferometry

Eye

Optics manufacturing

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