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Proceedings Article

Dynamic phase-shifting electronic speckle pattern interferometer

[+] Author Affiliations
Michael North Morris, James Millerd, Neal Brock, John Hayes

4D Technology Corp.

Babak Saif

Space Telescope Science Institute

Proc. SPIE 5869, Optical Manufacturing and Testing VI, 58691B (August 18, 2005); doi:10.1117/12.620619
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From Conference Volume 5869

  • Optical Manufacturing and Testing VI
  • H. Philip Stahl
  • San Diego, California, USA | July 31, 2005

abstract

The technique for measuring changes in diffuse surfaces using Electronic Speckle Pattern Interferometry (ESPI) is well known. We present a new electronic speckle pattern interferometer that takes advantage of a single-frame spatial phase-shifting technique to significantly reduce sensitivity to vibration and enable complete data acquisition in a single laser pulse. The interferometer was specifically designed to measure the stability of the James Webb Space Telescope (JWST) backplane. During each measurement the laser is pulsed once and four phase-shifted interferograms are captured in a single image. The signal is integrated over the 9ns pulse which is over six orders of magnitude shorter than the acquisition time for conventional interferometers. Consequently, the measurements do not suffer from the fringe contrast reduction and measurement errors that plague temporal phase-shifting interferometers in the presence of vibration. This paper will discuss the basic operating principle of the interferometer, analyze its performance and show some interesting measurements.

© (2005) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Michael North Morris ; James Millerd ; Neal Brock ; John Hayes and Babak Saif
"Dynamic phase-shifting electronic speckle pattern interferometer", Proc. SPIE 5869, Optical Manufacturing and Testing VI, 58691B (August 18, 2005); doi:10.1117/12.620619; http://dx.doi.org/10.1117/12.620619


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