Measurement of small birefringence in sapphire and quartz plates

Dennis H. Goldstein; Lynn L. Deibler; Baoliang Bob Wang

doi:10.1117/12.454834

25 September 2002 Measurement of small birefringence in sapphire and quartz plates

Dennis H. Goldstein, Lynn L. Deibler, Baoliang Bob Wang

Proceedings Volume 4819, Polarization Measurement, Analysis, and Applications V; (2002) https://doi.org/10.1117/12.454834
Event: International Symposium on Optical Science and Technology, 2002, Seattle, WA, United States

Abstract

Birefringence in quartz and sapphire plates was measured at 632.8 nm. The observed birefringence is presumed to be caused by a tilt in the optic axis with respect to the plate geometry. Two instrumental methods were used to make the measurements. A Mueller matrix laser polarimeter was used at the Air Force Research Laboratory, and the Exicor system was used at Hinds. The measurement techniques are described and results are presented.

Citation Download Citation

Dennis H. Goldstein, Lynn L. Deibler, and Baoliang Bob Wang "Measurement of small birefringence in sapphire and quartz plates", Proc. SPIE 4819, Polarization Measurement, Analysis, and Applications V, (25 September 2002); https://doi.org/10.1117/12.454834

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