Paper
5 February 2002 Statistics for partially developed speckles: the impact on speckle-based measurements
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Proceedings Volume 4607, Selected Papers from Fifth International Conference on Correlation Optics; (2002) https://doi.org/10.1117/12.455196
Event: Fifth International Conference on Correlation Optics, 2001, Chernivsti, Ukraine
Abstract
The treatment of first- and second order intensity statistics of light scattered from surfaces not giving rise to fully developed speckles will be presented. Analytical expressions will be given for speckle size, first-order intensity moments and intensity variance within the framework of using the Huygens-Fresnel integral with the complete optical system included by the complex valued system ray ABCD-matrix. Various surface models will be presented, all being based on a Gaussian height distribution with various lateral length scale(s). For the sake of simplicity, only rotationally symmetric optical systems will be treated and no depolarization effects during scattering will be included.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Steen Gruner Hanson, Rene Skov Hansen, and Harold T. Yura "Statistics for partially developed speckles: the impact on speckle-based measurements", Proc. SPIE 4607, Selected Papers from Fifth International Conference on Correlation Optics, (5 February 2002); https://doi.org/10.1117/12.455196
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KEYWORDS
Speckle

Correlation function

Surface roughness

Scattering

Light scattering

Sensors

Imaging systems

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