Scanning total internal reflection fluorescence microscopy

Min Gu; James Won Min Chon

doi:10.1117/12.529180

19 November 2003 Scanning total internal reflection fluorescence microscopy

Min Gu, James Won Min Chon

Proceedings Volume 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life; (2003) https://doi.org/10.1117/12.529180
Event: 19th Congress of the International Commission for Optics: Optics for the Quality of Life, 2002, Florence, Italy

Abstract

We report on a new form of total internal reflection fluorescence microscopy. Instead of using a prism, an objective of numerical aperture 1.65 is used under ring beam illumination. As a result, the propagating component of the illumination wave is suppressed and a focused evanescent spot is produced with strength of 20 times stronger than that in the prism. A near-field image is obtained by the scanning of a sample illuminated by the evanescent focal spot. The new imaging system has been successfully used for characterizing CdSe quantum dot nanoparticles and will be useful in nano-fabrication and single-molecular detection.

Citation Download Citation

Min Gu and James Won Min Chon "Scanning total internal reflection fluorescence microscopy", Proc. SPIE 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life, (19 November 2003); https://doi.org/10.1117/12.529180

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