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Proceedings Article

Carbon window soft x-ray imaging using multilayer optics

[+] Author Affiliations
Igor A. Artyukov, Ruslan M. Feschenko, Svetlana A. Romanova, Yuri A. Uspenski, Alexander V. Vinogradov

Lebedev Physical Institute (Russia)

Yegor Bugayev, Oleksandr Yu. Devizenko, Valeri V. Kondratenko

Kharkiv State Polytechnic Institute (Ukraine)

Yuri S. Kasyanov

General Physics Institute (Russia)

Sergei V. Saveliev

Institute of Human Morphology (Russia)

Franz Schäfers

BESSY GmbH (Germany)

Torsten Feigl

Fraunhofer-Institut für Angewandte Optik und Feinmechanik

Proc. SPIE 5919, Soft X-Ray Lasers and Applications VI, 59190E (September 13, 2005); doi:10.1117/12.620037
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From Conference Volume 5919

  • Soft X-Ray Lasers and Applications VI
  • Ernst E. Fill
  • San Diego, California, USA | July 31, 2005

abstract

The paper deals with the recent results of the experiments on soft X-ray imaging of various carbon-containing objects: biological samples, artificial carbon fibres, graphite slices, etc. The working wavelength was chosen to be 4.5 nm due to high penetration ability of these soft X-rays in the carbon materials. The experimental set-up included: laser plasma X-ray source (generated with the 2nd harmonics of Nd:YAG laser), scandium-based thin-film filter and highly reflective spherical multilayer mirror. The Co/C multilayer's reflectivity was measured to be about 15 % at normal incidence that was high enough to produce soft X-ray images using one nanosecond-long exposure. The work demonstrates a possibility to produce high contrast images outside "water window" region for study of relatively thick (tens of microns) samples that may lead to new fields of applications of the soft x-ray microscopy.

© (2005) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Igor A. Artyukov ; Yegor Bugayev ; Oleksandr Yu. Devizenko ; Ruslan M. Feschenko ; Yuri S. Kasyanov, et al.
"Carbon window soft x-ray imaging using multilayer optics", Proc. SPIE 5919, Soft X-Ray Lasers and Applications VI, 59190E (September 13, 2005); doi:10.1117/12.620037; http://dx.doi.org/10.1117/12.620037


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