Paper
3 March 2003 Development of in-process monitoring technique in YAG laser welding
Yasumasa Nakashima, Ken-ichi Kamimuki, Tokuhiro Nakabayashi, Kouichi Yoshida
Author Affiliations +
Proceedings Volume 4831, First International Symposium on High-Power Laser Macroprocessing; (2003) https://doi.org/10.1117/12.497924
Event: LAMP 2002: International Congress on Laser Advanced Materials Processing, 2002, Osaka, Japan
Abstract
We have studied in-process monitoring technique in Nd:YAG laser welding. We used a CCD camera and a photodiode as the monitoring sensor, and observed laser processing coaxially with the laser beam. There were differences in the image of the CCD camera between full and partial penetration welding and the detection for full and partial welding was achieved by the image processing of the detected image data. And, it was suggested that a change in the focal position could be detected because a change in the luminescence intensity could be caught with the photodiode when the deviation of the focal position occurred.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yasumasa Nakashima, Ken-ichi Kamimuki, Tokuhiro Nakabayashi, and Kouichi Yoshida "Development of in-process monitoring technique in YAG laser welding", Proc. SPIE 4831, First International Symposium on High-Power Laser Macroprocessing, (3 March 2003); https://doi.org/10.1117/12.497924
Lens.org Logo
CITATIONS
Cited by 2 scholarly publications and 1 patent.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Image processing

CCD cameras

CCD image sensors

Luminescence

Nd:YAG lasers

Photodiodes

Laser welding

Back to Top