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Proceedings Article

Submicron particle localization using evanescent field

[+] Author Affiliations
Martin Siler, Mojmir Sery, Tomas Cizmar, Pavel Zemanek

Institute of Scientific Instruments (Czech Republic)

Proc. SPIE 5930, Optical Trapping and Optical Micromanipulation II, 59300R (August 26, 2005); doi:10.1117/12.615741
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From Conference Volume 5930

  • Optical Trapping and Optical Micromanipulation II
  • Kishan Dholakia; Gabriel C. Spalding
  • San Diego, California, USA | July 31, 2005

abstract

Recently a non-contact organization of submicron colloidal particles on the surface attracted a great attention in connection with development of imaging techniques using total internal reflection. We focus here on the theoretical description of the forces acting on a submicron particle placed in an interference field created by two counter-propagating evanescent waves. Numerical results elucidate how these forces or trap depth depend on the particle size and angle of incidence of both beams. Experimental results proved these conclusions and several polystyrene particles of diameter 520 nm were confined in evanescent standing wave.

© (2005) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Martin Siler ; Mojmir Sery ; Tomas Cizmar and Pavel Zemanek
"Submicron particle localization using evanescent field", Proc. SPIE 5930, Optical Trapping and Optical Micromanipulation II, 59300R (August 26, 2005); doi:10.1117/12.615741; http://dx.doi.org/10.1117/12.615741


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