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Proceedings Article

High resolution index of refraction profiling of optical waveguides

[+] Author Affiliations
Roderick S. Taylor, Cyril Hnatovsky

National Research Council of Canada (Canada)

Proc. SPIE 4833, Applications of Photonic Technology 5, 811 (February 1, 2003); doi:10.1117/12.473921
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From Conference Volume 4833

  • Applications of Photonic Technology 5
  • Roger A. Lessard; George A. Lampropoulos; Gregory W. Schinn
  • Quebec City, Canada | June 02, 2002

abstract

A comparison is made between three high spatial resolution index of refraction profiling techniques:reflection-NSOM, microreflection and AFM plus selective chemical etching using the very small elliptical core of a polarization maintaining E-fiber from Andrew Corporation as a test waveguide.

© (2003) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Roderick S. Taylor and Cyril Hnatovsky
"High resolution index of refraction profiling of optical waveguides", Proc. SPIE 4833, Applications of Photonic Technology 5, 811 (February 1, 2003); doi:10.1117/12.473921; http://dx.doi.org/10.1117/12.473921


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