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Proceedings Article

Micromachining and material change characterization using femtosecond laser oscillators

[+] Author Affiliations
Christopher B. Schaffer, Juerg Aus der Au, Jeffrey A. Squier

Univ. of California/San Diego (USA)

Eric Mazur

Harvard Univ. (USA)

Proc. SPIE 4633, Commercial and Biomedical Applications of Ultrafast and Free-Electron Lasers, 112 (April 5, 2002); doi:10.1117/12.461370
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From Conference Volume 4633

  • Commercial and Biomedical Applications of Ultrafast and Free-Electron Lasers
  • Glenn S. Edwards; Joseph Neev; Andreas Ostendorf; John C. Sutherland
  • San Jose, CA | January 18, 2002

abstract

We use third harmonic generation (THG) microscopy to image waveguides and single-shot structural modifications produced in bulk glass using femtosecond laser pulses. THG microscopy reveals the internal structure of waveguides written with a femtosecond laser oscillator, and gives a three-dimensional view of the complicated morphology of the structural changes produced with single, above-threshold femtosecond pulses. We find that THG microscopy is as sensitive to refractive index change as differential interference contrast microscopy, while also offering the three-dimensional sectioning capabilities of a nonlinear microscopy technique. It is now possible to micromachine three-dimensional optical devices and to image these structures in three dimensions, all with a single femtosecond laser oscillator.

© (2002) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Christopher B. Schaffer ; Juerg Aus der Au ; Eric Mazur and Jeffrey A. Squier
"Micromachining and material change characterization using femtosecond laser oscillators", Proc. SPIE 4633, Commercial and Biomedical Applications of Ultrafast and Free-Electron Lasers, 112 (April 5, 2002); doi:10.1117/12.461370; http://dx.doi.org/10.1117/12.461370


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