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Proceedings Article

Diode laser testing by taking advantage of its photoelectric properties

[+] Author Affiliations
Jens W. Tomm

Max-Born-Institut fuer Nichtlineare Optik und Kurzzeitspektroskopie (Germany)

A. Gerhardt

Max-Born Institut fuer Nichtlineare Optik und Kurzzeitspektroskopie (Germany)

Dirk Lorenzen, P. Henning

JENOPTIK Laserdiode GmbH (Germany)

H. Roehle

Heinrich-Hertz Institut fur Nachrichtentechnik (Germany)

Proc. SPIE 4648, Test and Measurement Applications of Optoelectronic Devices, 9 (April 18, 2002); doi:10.1117/12.462652
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From Conference Volume 4648

  • Test and Measurement Applications of Optoelectronic Devices
  • Aland K. Chin; Niloy K. Dutta; Robert W. Herrick; Kurt J. Linden; Daniel J. McGraw
  • San Jose, CA | January 18, 2002

abstract

We report on the potential of the photocurrent technique as analytical tool for diode laser testing. The physics involved into the generation of photocurrents as well as experimental requirements for detecting them are highlighted. Based on a number of practical examples, we demonstrate how knowledge about the photoelectrical properties of diode lasers can help to learn about stress and defects within packaged devices or how non-perfect device fabrication may be discovered. These results are discussed in conjunction with device reliability issues.

© (2002) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Jens W. Tomm ; A. Gerhardt ; Dirk Lorenzen ; P. Henning and H. Roehle
"Diode laser testing by taking advantage of its photoelectric properties", Proc. SPIE 4648, Test and Measurement Applications of Optoelectronic Devices, 9 (April 18, 2002); doi:10.1117/12.462652; http://dx.doi.org/10.1117/12.462652


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