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Proceedings Article

Superluminescent diodes for optical coherence tomography

[+] Author Affiliations
Vladimir R. Shidlovski

Superlum Diodes, Ltd. (Russia)

Jay Wei

Zeiss Humphrey Systems (USA)

Proc. SPIE 4648, Test and Measurement Applications of Optoelectronic Devices, 139 (April 18, 2002); doi:10.1117/12.462650
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From Conference Volume 4648

  • Test and Measurement Applications of Optoelectronic Devices
  • Aland K. Chin; Niloy K. Dutta; Robert W. Herrick; Kurt J. Linden; Daniel J. McGraw
  • San Jose, CA | January 18, 2002

abstract

We summarize the results of development of superluminescent diodes (SLEDs) for OCT applications. It is shown that powerful, wide spectrum and low rippled SLEDs may be realized at different spectral bands from 800 nm to 1600 nm on the base of relatively simple bent-angled SLED structure with double-layer protective/antireflective (AR) coatings on both facets of SLED crystal. Up to 100 mW free space and 30 mW SM fiber couple outputs are realized at 820 and 980 nm bands, and 15-35 mW free space (5-15 mW SM fiber) at 1550 nm and 1300 nm bands. Various methods to widen SLED spectrum are presented. 50 nm of gaussian-like spectrum is obtained from 1040 nm SLD. 70 nm FWHM and 20 mW free space output power is realized at 940 nm by u sing two-electrode pumping of strained QW SLED. 70 nm FWHM is obtained from 1550 nm band MQW SLED with 5 mW output power. All SLDs are characterized by very low parasitic Fabry-Perot modulation. Example of SLED use in commercial OCT setup is presented.

© (2002) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Vladimir R. Shidlovski and Jay Wei
"Superluminescent diodes for optical coherence tomography", Proc. SPIE 4648, Test and Measurement Applications of Optoelectronic Devices, 139 (April 18, 2002); doi:10.1117/12.462650; http://dx.doi.org/10.1117/12.462650


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