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Proceedings Article

Proton-induced leakage current in CCDs

[+] Author Affiliations
David R. Smith, Andrew D. Holland, Richard M. Ambrosi, Ian Hutchinson

Univ. of Leicester (United Kingdom)

Mark S. Robbins

E2V Technologies (United Kingdom)

Proc. SPIE 4851, X-Ray and Gamma-Ray Telescopes and Instruments for Astronomy, 842 (March 10, 2003); doi:10.1117/12.461331
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From Conference Volume 4851

  • X-Ray and Gamma-Ray Telescopes and Instruments for Astronomy
  • Joachim E. Truemper; Harvey D. Tananbaum
  • Waikoloa, Hawai'i, United States | August 22, 2002

abstract

The effect of different proton fluences on the performance of two E2V Technologies CCD47-20 devices was investigated with particular emphasis given to the analysis of 'random telegraph signal' (RTS) generation, bright pixel generation and induced changes in base dark current level. The results show that bright pixel frequency increases as the mean energy of the proton beam is increased, and that the base dark current level after irradiation scales with the level of ionization damage. For the RTS study, 500 pixels on one device were monitored over a twelve hour period. This data set revealed a number of distinct types of pixel change level fluctuation and a system of classification has been devised. Previously published RTS data is discussed and reviewed in light of the new data.

© (2003) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

David R. Smith ; Andrew D. Holland ; Mark S. Robbins ; Richard M. Ambrosi and Ian Hutchinson
"Proton-induced leakage current in CCDs", Proc. SPIE 4851, X-Ray and Gamma-Ray Telescopes and Instruments for Astronomy, 842 (March 10, 2003); doi:10.1117/12.461331; http://dx.doi.org/10.1117/12.461331


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