A characterization of optical surface properties, especially in terms of the human visual perception, demands the use of BRDF data over a wide spectral range, at least over VIS. Further it could be interesting to perform a fast optical material recognition in industrial metrology. For the fast acquisition of large amounts of BRDF data over wavelength a small, fast and rugged spectro-radiometer without moving parts for angular resolution was developed. The semi- hemispherical measurement system is derived from a full-hemispherical set-up. It consists of a catadioptric system with an elliptical mirror mapping a semi-hemisphere onto a commercially available cartesian CMOS sensor with a dynamic range of 112dB. The sensor consists of 322096 pixels, producing an equivalent angle resolution. The system can take up to 53 semi-hemispherical BRDFs per second. The incoherent illumination is provided by a set of assorted LEDs. A radiometric measurement is possible over a wide spectral range from VIS to NIR over approximately 6.5 decades. Fast property characterization and material recognition from multivariate data in industrial applications demand appropriate analysis methods. As an analysis method a linear canonical discriminant analysis is applied to the data over angles and wavelength. In the paper measurement analysis results of the spectral signatures of various materials and test surfaces will be presented. Classification results and performances will be compared and discussed.© (2005) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.