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Proceedings Article

Direct comparision of the damage frequency method and binary search technique

[+] Author Affiliations
Jonathan W. Arenberg

Northrop Grumman Space Technology

Proc. SPIE 5991, Laser-Induced Damage in Optical Materials: 2005, 599125 (February 07, 2006); doi:10.1117/12.637602
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From Conference Volume 5991

  • Laser-Induced Damage in Optical Materials: 2005
  • Gregory J. Exarhos; Arthur H. Guenther; Keith L. Lewis; Detlev Ristau; M.J. Soileau; Christopher J. Stolz
  • Boulder, CO | September 19, 2005

abstract

This paper presents a direct comparison of the two main techniques for the determination of laser damage threshold. The two techniques are compared directly to understand the intrinsic biases of each test and what is causing these biases. The comparison is done in terms of accuracy and repeatability of the resulting measurements. It will be shown that under the vast majority of cases the damage frequency method underestimates the true value and has poor repeatability and that the binary search method over estimates the threshold, but is far more repeatable.

© (2005) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Jonathan W. Arenberg
"Direct comparision of the damage frequency method and binary search technique", Proc. SPIE 5991, Laser-Induced Damage in Optical Materials: 2005, 599125 (February 07, 2006); doi:10.1117/12.637602; http://dx.doi.org/10.1117/12.637602


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