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Proceedings Article

Developments at NIST on traceability in dimensional measurements

[+] Author Affiliations
Dennis A. Swyt, Steven D. Phillips

National Institute of Standards and Technology (USA)

John W. Palmateer

Boeing Co. (USA)

Proc. SPIE 4401, Recent Developments in Traceable Dimensional Measurements, 245 (October 22, 2001); doi:10.1117/12.445626
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From Conference Volume 4401

  • Recent Developments in Traceable Dimensional Measurements
  • Jennifer E. Decker; Nicholas Brown
  • Munich, Germany | June 18, 2001

abstract

This paper reports to the international community on recent developments in technical policies, programs, and capabilities at the U.S. (United States) National Institute of Standards and Technology (NIST) related to traceability in dimensional measurements. These developments include: formal NIST policies on traceability and assuring quality in the results of the measurements it delivers to customers in calibration and measurement certificates, and a program to support the achievement of traceability to the SI (International System of Units) unit of length in dimensional measurements by manufacturers without direct recourse to a National Metrology Institute (NMI) for dimensional calibrations.

© (2001) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Dennis A. Swyt ; Steven D. Phillips and John W. Palmateer
"Developments at NIST on traceability in dimensional measurements", Proc. SPIE 4401, Recent Developments in Traceable Dimensional Measurements, 245 (October 22, 2001); doi:10.1117/12.445626; http://dx.doi.org/10.1117/12.445626


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