Paper
27 May 2003 Fundamentals and applications of speckle
Author Affiliations +
Proceedings Volume 4933, Speckle Metrology 2003; (2003) https://doi.org/10.1117/12.516567
Event: Speckle Metrology 2003, 2003, Trondheim, Norway
Abstract
Speckle arises from interference of many waves with random phase relationship. In spite of its random appearance its statistical properties are independent of surface roughness of diffusers and depend only on macroscopic parameters of optical systems under usual conditions of observation. In this article we first discuss the size distribution of speckle from physical viewpoints. Then we describe the dynamic behaviors of speckle that are caused by displacement and deformation of diffuse surfaces as well as by change in optical system. Finally we overview applications of these properties of speckle to measurement of displacement and deformation.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ichirou Yamaguchi "Fundamentals and applications of speckle", Proc. SPIE 4933, Speckle Metrology 2003, (27 May 2003); https://doi.org/10.1117/12.516567
Lens.org Logo
CITATIONS
Cited by 15 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Speckle

Diffraction

Speckle pattern

Surface roughness

Photography

Laser marking

Charge-coupled devices

RELATED CONTENT

Speckle displacement in holographic and speckle metrology
Proceedings of SPIE (November 02 2011)
Measurement and testing by digital speckle correlation
Proceedings of SPIE (October 13 2008)
Optical analysis of particle image velocimetry data
Proceedings of SPIE (November 01 1990)

Back to Top