Paper
27 May 2003 Improvement of interferometric phase measurements by consideration of the speckle field topology
Author Affiliations +
Proceedings Volume 4933, Speckle Metrology 2003; (2003) https://doi.org/10.1117/12.516634
Event: Speckle Metrology 2003, 2003, Trondheim, Norway
Abstract
Phase measurements require the measurement of interferogram intensities. In this paper it is investigated how the validity of the evaluated phase is affected by the averaging of the interferogram intensities across the pixels of a CCD-array. In our previous works it has been shown numerically that the validity of the phase values depends on the topology of the speckle field. Here, it is examined analytically how the topology influences the phase evaluation with respect to averaging. One result is that in certain cases the absolute value of the phase gradient can be determined solely from the intensity of the speckle field, without any reference beam. Based on this result the phase error at intensity maxima, saddle points and for stationary points of the phase is examined.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ervin Kolenovic, Wolfgang Osten, and Werner P.O. Juptner "Improvement of interferometric phase measurements by consideration of the speckle field topology", Proc. SPIE 4933, Speckle Metrology 2003, (27 May 2003); https://doi.org/10.1117/12.516634
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Cited by 2 scholarly publications.
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KEYWORDS
Speckle

Phase measurement

Phase shift keying

Error analysis

Interferometry

Modulation

CCD cameras

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