Full Content is available to subscribers

Subscribe/Learn More  >
Proceedings Article

Novel optical microscopy

[+] Author Affiliations
Norbert Kroo

Research Institute for Solid State Physics and Optics and Max-Planck-Institut fuer Quanten (Hungary)

Proc. SPIE 4430, ROMOPTO 2000: Sixth Conference on Optics, 342 (June 29, 2001); doi:10.1117/12.432864
Text Size: A A A
From Conference Volume 4430

  • ROMOPTO 2000: Sixth Conference on Optics
  • Valentin I. Vlad
  • Bucharest, Romania | September 04, 2000


Near field microscopy has proved to be an efficient tool to break the Rayleigh criterion of resolution. A high spatial frequency object generates evanescent waves if illuminated by propagating or evanescent waves. The generated, non- detectable local field may partly be turned into a propagating wave by a small scatterer, which can already be detected, reflecting the spatial structure of the object. This principle is used in different forms in sub-wavelength resolution microscopy down to the nanometer scale. If the scatterer is the tip of a scanning tunneling microscope (STM), the evanescent field-tip interaction leads to the change of the tunneling current, resulting in a special type of the near field microscope. The evanescent field could be that of surface plasmon oscillations (SPO). The state of art of near field microscopy, and as an example the SPO-STM case, is discussed in detail.

© (2001) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.

Norbert Kroo
"Novel optical microscopy", Proc. SPIE 4430, ROMOPTO 2000: Sixth Conference on Optics, 342 (June 29, 2001); doi:10.1117/12.432864; http://dx.doi.org/10.1117/12.432864

Access This Article
Sign In to Access Full Content
Please Wait... Processing your request... Please Wait.
Sign in or Create a personal account to Buy this article ($15 for members, $18 for non-members).



Citing articles are presented as examples only. In non-demo SCM6 implementation, integration with CrossRef’s "Cited By" API will populate this tab (http://www.crossref.org/citedby.html).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging & repositioning the boxes below.

Related Book Chapters

Topic Collections


Buy this article ($18 for members, $25 for non-members).
Sign In