Paper
9 November 2001 Quality assurance of HARMS and MOEMS surface structures using confocal white light microscopy
Hans-Joachim Jordan, Rainer Brodmann, Marcus Grigat, Juergen Valentin
Author Affiliations +
Abstract
The commercial success in micro-system technologies depends on a reliable and controlled mass production. Without a good quality assurance and process control it is impossible to guarantee the specifications of the products and to minimize the production costs. Among test equipment for the function of the end product it is necessary to introduce dimensional metrology devices for checking vertical and lateral structures in silicon or PMMA materials close to production machines. Due to the small dimensions of HARMS or MOEMS components, traditional surface testers as mechanical stylus instruments are not able to analyze structures with high aspect ratio. In this paper a new approach to surface measurement technique, the confocal white light microscopy, is described which opens the possibility to measure soft or transparent materials from the nanometer up to the millimetre range. In contrast to other methods, like phase shift interferometry, the confocal measurement technique is nearly free of artefacts due to physical pinhole filter masks.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hans-Joachim Jordan, Rainer Brodmann, Marcus Grigat, and Juergen Valentin "Quality assurance of HARMS and MOEMS surface structures using confocal white light microscopy", Proc. SPIE 4440, Lithographic and Micromachining Techniques for Optical Component Fabrication, (9 November 2001); https://doi.org/10.1117/12.448058
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CITATIONS
Cited by 5 scholarly publications.
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KEYWORDS
Confocal microscopy

Microscopes

3D metrology

3D image processing

Microscopy

Sensors

Microopto electromechanical systems

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