Microscopic model for static and dynamic loading of chiral sculptured thin films

Akhlesh Lakhtakia

doi:10.1117/12.432924

9 July 2001 Microscopic model for static and dynamic loading of chiral sculptured thin films

Akhlesh Lakhtakia

Proceedings Volume 4467, Complex Mediums II: Beyond Linear Isotropic Dielectrics; (2001) https://doi.org/10.1117/12.432924
Event: International Symposium on Optical Science and Technology, 2001, San Diego, CA, United States

Abstract

The localized homogenization framework, the Mori-Tanaka average stress and the Eshelby tensor for ellipsoids are used to estimate the elastic constitutive properties of chiral sculptured thin films from their microstructural details. The devised model contains five arbitrary parameters, whose values can be decided upon by suitable experimentation. The responses of a chiral STF to static and dynamic loading along the axis of nonhomogeneity are presented.

Citation Download Citation

Akhlesh Lakhtakia "Microscopic model for static and dynamic loading of chiral sculptured thin films", Proc. SPIE 4467, Complex Mediums II: Beyond Linear Isotropic Dielectrics, (9 July 2001); https://doi.org/10.1117/12.432924

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