Performance of reflection polarizers using bare semiconductor substrates in the visible and UV spectral range

Aed M. El-Saba; Rasheed M. A. Azzam

doi:10.1117/12.452872

9 January 2002 Performance of reflection polarizers using bare semiconductor substrates in the visible and UV spectral range

Aed M. El-Saba, Rasheed M. A. Azzam

Author Affiliations +

Proceedings Volume 4481, Polarization Analysis and Measurement IV; (2002) https://doi.org/10.1117/12.452872
Event: International Symposium on Optical Science and Technology, 2001, San Diego, CA, United States

Abstract

Performance of reflection polarizers using bare semiconductor substrates in the visible and UV spectral range is presented. Performance evaluation based on extinction ratio, throughput, and sensitivity to angular and spectral variations of Si and Ge reflection polarizers are considered.

Citation Download Citation

Aed M. El-Saba and Rasheed M. A. Azzam "Performance of reflection polarizers using bare semiconductor substrates in the visible and UV spectral range", Proc. SPIE 4481, Polarization Analysis and Measurement IV, (9 January 2002); https://doi.org/10.1117/12.452872

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