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Proceedings Article

Shack-Hartmann wavefront sensor precision and accuracy

[+] Author Affiliations
Daniel R. Neal, James Copland, David A. Neal

WaveFront Sciences, Inc. (USA)

Proc. SPIE 4779, Advanced Characterization Techniques for Optical, Semiconductor, and Data Storage Components, 148 (November 1, 2002); doi:10.1117/12.450850
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From Conference Volume 4779

  • Advanced Characterization Techniques for Optical, Semiconductor, and Data Storage Components
  • Angela Duparr‰; Bhanwar Singh
  • Seattle, WA | July 07, 2002

abstract

The design of a wavefront sensor may be determined by the lenslet array and camera selection. There are numerous different applications for these sensors, requiring widely differing dynamic range and accuracy. Performance metrics are needed to evaluate candidate designs and to compare results. We have developed a standard methodology for measuring the repeatability, accuracy and dynamic range of different wavefront sensor designs, and have experimentally applied these metrics to a number of different sensors.

© (2002) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Daniel R. Neal ; James Copland and David A. Neal
"Shack-Hartmann wavefront sensor precision and accuracy", Proc. SPIE 4779, Advanced Characterization Techniques for Optical, Semiconductor, and Data Storage Components, 148 (November 1, 2002); doi:10.1117/12.450850; http://dx.doi.org/10.1117/12.450850


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