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Proceedings Article

Optics for coherent x-ray sources

[+] Author Affiliations
Richard H. Pantell, Joseph Feinstein

Stanford Univ. (USA)

J. Theodore Cremer, Melvin A. Piestrup, H. R. Beguiristain, Charles K. Gary

Adelphi Technology Inc. (USA)

Proc. SPIE 4500, Optics for Fourth-Generation X-Ray Sources, 123 (December 28, 2001); doi:10.1117/12.452968
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From Conference Volume 4500

  • Optics for Fourth-Generation X-Ray Sources
  • Roman O. Tatchyn; Andreas K. Freund; Tadashi Matsushita
  • San Diego, CA, USA | July 29, 2001

abstract

Several laboratories are now in the process of designing and constructing coherent x-ray sources, and application of these beams for radiography and material studies is facilitated by having appropriate optical components to provide collimation or focusing. Control of x-rays can be achieved by employing elements that perform refraction, diffraction or reflection, as exemplified by a lens, grating or mirror, respectively. Of course, the maximum intensity of minimum image size that is obtainable from any of these elements is determined by diffraction effects. Using the parameters of the Liinac Coherent Light Source (LCLS) being studied at the Stanford Synchrotron Radiation Laboratory (SSRL), x-ray optical components can increase the beam intensity approximately eight orders of magnitude and provide submicron images. Performance comparisons are made between the zone plate, the phase zone plate, the compound refractive lens, the Fresnel compound refractive lens, and the parabolic mirror.

© (2001) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Richard H. Pantell ; Joseph Feinstein ; J. Theodore Cremer ; Melvin A. Piestrup ; H. R. Beguiristain, et al.
"Optics for coherent x-ray sources", Proc. SPIE 4500, Optics for Fourth-Generation X-Ray Sources, 123 (December 28, 2001); doi:10.1117/12.452968; http://dx.doi.org/10.1117/12.452968


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