Relevant modeling and comparison of geometric distortions in watermarking systems

Damien Delannay; Iwan Setyawan; Reginald L. Lagendijk; Benoît M. M. Macq

doi:10.1117/12.455357

21 November 2002 Relevant Modelling & Comparison of Geometric Distortions in Watermarking Systems

Damien Delannay, Iwan Setyawan, Reginald L. Lagendijk, Benoît M. M. Macq

Proceedings Volume 4790, Applications of Digital Image Processing XXV; (2002) https://doi.org/10.1117/12.455357
Event: International Symposium on Optical Science and Technology, 2002, Seattle, WA, United States

Abstract

A challenging aspect in the development of robust watermarking algorithms is the ability to withstand complex geometric distortion of the media. A few existing techniques are known to deal with such transformations up to a certain level. Traditionally, the measure of the degradation caused by an attack on an image only addressed the pixel value modification. However, a degradation consequent to the geometric distortion of an image cannot be measured with traditional criteria. Therefore the evaluation and comparison of the robustness to desynchronization of different watermarking schemes was not possible. In this paper, we present an innovative method to measure the distortion introduced by complex geometric deformations of an image. The distortion measure is expressed in term of how closely the applied transform can be approximated by a simpler transform model (e.g. RST transform, affine transform). The scheme relies on the local least square estimation of the parameters of the reference transform model. Eventually, we illustrate the proposed measure by presenting some results for different complex image distortions.

Citation Download Citation

Damien Delannay, Iwan Setyawan, Reginald L. Lagendijk, and Benoît M. M. Macq "Relevant Modelling & Comparison of Geometric Distortions in Watermarking Systems", Proc. SPIE 4790, Applications of Digital Image Processing XXV, (21 November 2002); https://doi.org/10.1117/12.455357

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