Paper
9 October 2000 Raman and x-ray diffraction study on the material property of oxyfluoride vitroceramics
Xiaobo Chen, N. Sawanobori, Yulong Liu
Author Affiliations +
Proceedings Volume 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications; (2000) https://doi.org/10.1117/12.402581
Event: Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments, 2000, Beijing, China
Abstract
Upconversion study is imperative now to find good material that has high laser damage threshold, good physics and chemical property, easy in processing in order to develop various up- conversion applications. This paper studies the material property of oxyfluoride vitroceramics by Raman and x-ray diffraction spectroscopy. It reveals the physical reason why the Er3+ ion's upconversion luminescence in oxyfluoride vitroceramics is 101 times greater than that in oxyfluoride glass.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xiaobo Chen, N. Sawanobori, and Yulong Liu "Raman and x-ray diffraction study on the material property of oxyfluoride vitroceramics", Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, (9 October 2000); https://doi.org/10.1117/12.402581
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KEYWORDS
Luminescence

Glasses

Upconversion

Raman spectroscopy

X-ray diffraction

Ions

Physics

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