Vision-based algorithms for high-accuracy measurements in an industrial bakery

Paulo Heleno; Roger Davies; Bento A. Brazio Correia; Joao Dinis

doi:10.1117/12.455249

11 February 2002 Vision-based algorithms for high-accuracy measurements in an industrial bakery

Paulo Heleno, Roger Davies, Bento A. Brazio Correia, Joao Dinis

Proceedings Volume 4567, Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology II; (2002) https://doi.org/10.1117/12.455249
Event: Intelligent Systems and Advanced Manufacturing, 2001, Boston, MA, United States

Abstract

This paper describes the machine vision algorithms developed for VIP3D, a measuring system used in an industrial bakery to monitor the dimensions and weight of loaves of bread (baguettes). The length and perimeter of more than 70 different varieties of baguette are measured with 1-mm accuracy, quickly, reliably and automatically. VIP3D uses a laser triangulation technique to measure the perimeter. The shape of the loaves is approximately cylindrical and the perimeter is defined as the convex hull of a cross-section perpendicular to the baguette axis at mid-length. A camera, mounted obliquely to the measuring plane, captures an image of a laser line projected onto the upper surface of the baguette. Three cameras are used to measure the baguette length, a solution adopted in order to minimize perspective-induced measurement errors. The paper describes in detail the machine vision algorithms developed to perform segmentation of the laser line and subsequent calculation of the perimeter of the baguette. The algorithms used to segment and measure the position of the ends of the baguette, to sub-pixel accuracy, are also described, as are the algorithms used to calibrate the measuring system and compensate for camera-induced image distortion.

Citation Download Citation

Paulo Heleno, Roger Davies, Bento A. Brazio Correia, and Joao Dinis "Vision-based algorithms for high-accuracy measurements in an industrial bakery", Proc. SPIE 4567, Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology II, (11 February 2002); https://doi.org/10.1117/12.455249

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