Paper
14 February 2002 Single-crystal sapphire high-temperature sensor
Yibing Zhang, Bing Qi, Yuhong Duan, Yan Zhang, Gary R. Pickrell, Russell G. May, Anbo Wang
Author Affiliations +
Proceedings Volume 4578, Fiber Optic Sensor Technology and Applications 2001; (2002) https://doi.org/10.1117/12.456072
Event: Environmental and Industrial Sensing, 2001, Boston, MA, United States
Abstract
With a single-crystal sapphire disk as the sensing element, a broadband polarimetric interferometer (BPI) based high temperature sensor is presented. The state of polarization of the broadband incident light is modulated by the birefringence of the sapphire disk and becomes a wavelength-encoded signal, which is detected by an optical spectrum analyzer (OSA). From the detected optical spectrum, an internally developed algorithm is employed to measure the difference of optical paths between two orthogonal linearly polarized lights in the sapphire disk, which is uniquely determined by environment temperature. A wide dynamic measurement range (from room temperature up to 1600 degrees Celsius) with a resolution less than 1 degree(s)C and accuracy 0.26% full scale is achieved. The great advantages of this sensor are its simplicity and long-term stability in the harsh environment.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yibing Zhang, Bing Qi, Yuhong Duan, Yan Zhang, Gary R. Pickrell, Russell G. May, and Anbo Wang "Single-crystal sapphire high-temperature sensor", Proc. SPIE 4578, Fiber Optic Sensor Technology and Applications 2001, (14 February 2002); https://doi.org/10.1117/12.456072
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Cited by 2 scholarly publications.
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KEYWORDS
Sapphire

Sensors

Temperature metrology

Calibration

Light emitting diodes

Polarimetry

Polarizers

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