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Proceedings Article

Reflectance standards at ultraviolet wavelengths

[+] Author Affiliations
Patricia Y. Barnes, Maria E. Nadal, Edward A. Early

National Institute of Standards and Technology (USA)

Proc. SPIE 3818, Ultraviolet Atmospheric and Space Remote Sensing: Methods and Instrumentation II, 9 (September 28, 1999); doi:10.1117/12.364154
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From Conference Volume 3818

  • Ultraviolet Atmospheric and Space Remote Sensing: Methods and Instrumentation II
  • George R. Carruthers; Kenneth F. Dymond
  • Denver, CO | July 18, 1999

abstract

Polytetrafluoroethylene (PTFE) is widely used in remote sensing applications requiring a diffuse reflectance standard for detector calibration. The bi-directional and directional-hemispherical reflectance properties of both pressed and sintered PTFE were measured at ultraviolet wavelengths to provide information for their use as standards in this spectral range. The reflectance decreases with decreasing wavelength for both geometries, and the ratio between the reflectances for these geometries remains constant for wavelengths from 300 nm to 400 nm.

© (1999) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Patricia Y. Barnes ; Maria E. Nadal and Edward A. Early
"Reflectance standards at ultraviolet wavelengths", Proc. SPIE 3818, Ultraviolet Atmospheric and Space Remote Sensing: Methods and Instrumentation II, 9 (September 28, 1999); doi:10.1117/12.364154; http://dx.doi.org/10.1117/12.364154


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