Paper
8 September 1999 Computer simulation of optical coating deposition monitored by transmission turning point
Xiaohui Zhang, Weiming Zhu, Xiaoping Li, Qingming Chen
Author Affiliations +
Proceedings Volume 3862, 1999 International Conference on Industrial Lasers; (1999) https://doi.org/10.1117/12.361097
Event: International Symposium on Industrial Lasers, 1999, Wuhan, China
Abstract
The relations between the precision of the transmittance turning point monitoring system and the thickness error of the monitored thin film layer are analyzed in this paper. The functions are derived under different conditions. This paper has developed a program to simulate the structures of deposited coatings and the real-time variation of the transmittance through the thin film stake and substrate assembly in deposition process that take the transmission turning point monitoring approach. The simulated value of the thickness of each layer after deposition is composed of the thickness correspond to the transmittance extreme found by 1D search algorithm and random thickness error calculated by the relations mentioned above. The computer simulation accord with the experiment results.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xiaohui Zhang, Weiming Zhu, Xiaoping Li, and Qingming Chen "Computer simulation of optical coating deposition monitored by transmission turning point", Proc. SPIE 3862, 1999 International Conference on Industrial Lasers, (8 September 1999); https://doi.org/10.1117/12.361097
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KEYWORDS
Computer simulations

Optical coatings

Transmittance

Thin films

Thin film coatings

Refractive index

Computing systems

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