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Proceedings Article

Measurement of the infrared refractive index of sapphire as a function of temperature

[+] Author Affiliations
Di Yang, Michael E. Thomas

The Johns Hopkins Univ. (USA)

Simon G. Kaplan

National Institute of Standards and Technology (USA)

Proc. SPIE 4375, Window and Dome Technologies and Materials VII, 53 (September 7, 2001); doi:10.1117/12.439193
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From Conference Volume 4375

  • Window and Dome Technologies and Materials VII
  • Randal W. Tustison
  • Orlando, FL | April 16, 2001

abstract

A complete and independent method is used to measure the infrared refractive index of sapphire, both e-ray and o-ray, as a function of temperature and frequency. The technique combines single frequency and broadband measurements. The refractive index at the wavelength 3.39micrometers is measured using a prism and the minimum deviation method. A laser interferometer and an etalon of the material are then used to measure the thermo-optic coefficient also at 3.39micrometers . A broadband FTIR spectrometer is used to measure the transmittance spectrum of the etalon and then a fringe counting method is applied to obtain the frequency dependent refractive index. The technique is applied to sapphire over the temperature range from room temperature to 600 degree(s)C and wavelength range from 1 to 5micrometers . High accuracy is demonstrated. The errors of this experimental approach are analyzed.

© (2001) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Di Yang ; Michael E. Thomas and Simon G. Kaplan
"Measurement of the infrared refractive index of sapphire as a function of temperature", Proc. SPIE 4375, Window and Dome Technologies and Materials VII, 53 (September 7, 2001); doi:10.1117/12.439193; http://dx.doi.org/10.1117/12.439193


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