Full Content is available to subscribers

Subscribe/Learn More  >
Proceedings Article

Luminescence investigation of SiO2 surfaces damaged by 0.35-nm laser illumination

[+] Author Affiliations
Mark R. Kozlowski, Colin L. Battersby, Stavros G. Demos

Lawrence Livermore National Lab. (USA)

Proc. SPIE 3902, Laser-Induced Damage in Optical Materials: 1999, 138 (March 3, 2000); doi:10.1117/12.379338
Text Size: A A A
From Conference Volume 3902

  • Laser-Induced Damage in Optical Materials: 1999
  • Gregory J. Exarhos; Arthur H. Guenther; Mark R. Kozlowski; Keith L. Lewis; M. J. Soileau
  • Boulder, CO | October 04, 1999

abstract

Following initiation at absorbing surface flaws, UV laser- induced damage to polished fused-silica surfaces continues to grow upon subsequent illumination. In this study photoluminescence spectroscopy was used to detect the formation of a modified, absorbing layers of silica that could be responsible for the continued growth of the damage site. For damage sites created with pulsed 355 nm illumination, three characteristic photoluminescence peaks are detected within the damage sites when excited with a 351 nm CW beam. Two of the peaks are likely due to the well- known E' and NBOHC defects associated with oxygen vacancies and broken Si-O bonds, respectively. The third, and dominant, peak at 560 nm has not been clearly identified, but is likely associated with a change in stoichiometry of the silica. The relative intensities of the peaks are non- uniform across individual damage sties. The photoluminescence data is being combined with insights from various optical and optical and electron microscopies to develop an understanding of laser-induced damage sties. The objective is to develop strategies to slow or stop the growth of the damage sites.

© (2000) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Mark R. Kozlowski ; Colin L. Battersby and Stavros G. Demos
"Luminescence investigation of SiO2 surfaces damaged by 0.35-nm laser illumination", Proc. SPIE 3902, Laser-Induced Damage in Optical Materials: 1999, 138 (March 3, 2000); doi:10.1117/12.379338; http://dx.doi.org/10.1117/12.379338


Access This Proceeding
Sign in or Create a personal account to Buy this proceeding ($15 for members, $18 for non-members).

Figures

Tables

NOTE:
Citing articles are presented as examples only. In non-demo SCM6 implementation, integration with CrossRef’s "Cited By" API will populate this tab (http://www.crossref.org/citedby.html).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging & repositioning the boxes below.

Related Book Chapters

Topic Collections

Advertisement
  • Don't have an account?
  • Subscribe to the SPIE Digital Library
  • Create a FREE account to sign up for Digital Library content alerts and gain access to institutional subscriptions remotely.
Access This Proceeding
Sign in or Create a personal account to Buy this proceeding ($15 for members, $18 for non-members).
Access This Proceeding
Sign in or Create a personal account to Buy this article ($15 for members, $18 for non-members).
Access This Chapter

Access to SPIE eBooks is limited to subscribing institutions and is not available as part of a personal subscription. Print or electronic versions of individual SPIE books may be purchased via SPIE.org.