Production of a high-resolution spot for ellipsometric scanning immunology using an off-the-shelf light-emitting diode

Stephen M. Tobin; Shao Yang

doi:10.1117/12.405218

24 October 2000 Production of a high-resolution spot for ellipsometric scanning immunology using an off-the-shelf light-emitting diode

Stephen M. Tobin, Shao Yang

Author Affiliations +

Proceedings Volume 4093, Current Developments in Lens Design and Optical Systems Engineering; (2000) https://doi.org/10.1117/12.405218
Event: International Symposium on Optical Science and Technology, 2000, San Diego, CA, United States

Abstract

A modified ellipsometric optical system has been designed for an in-vitro medical diagnostic instrument using an off- the-shelf 525-nm LED source. System requirements included a 20 degree (+/- 1 deg) incident angle, 1 uW (min) assay surface incident power, 300 um (max) incident spot diameter (full spatial extent) and 500:1 (min) detector S/N in normal room light. The fixed polarization ellipsometric optical analysis method is discussed, and the lens prescription used in a prototype instrument is given. Zemas spot size analyses are given, as well as a theoretical model for S/N assessment. Incident spot size and optical power data are provided which agree with the theory presented. Finally, the application of results and typical scanned signal output are discussed.

Citation Download Citation

Stephen M. Tobin and Shao Yang "Production of a high-resolution spot for ellipsometric scanning immunology using an off-the-shelf light-emitting diode", Proc. SPIE 4093, Current Developments in Lens Design and Optical Systems Engineering, (24 October 2000); https://doi.org/10.1117/12.405218

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