Near-field optical-beam-induced current spectroscopy as a tool for analyzing aging processes in diode lasers

Jens Wolfgang Tomm; Alexander Richter; Christoph Lienau; Thomas Elsaesser; Johann Luft

doi:10.1117/12.273804

2 May 1997 Near-field optical-beam-induced current spectroscopy as a tool for analyzing aging processes in diode lasers

Jens Wolfgang Tomm, Alexander Richter, Christoph Lienau, Thomas Elsaesser, Johann Luft

Proceedings Volume 3001, In-Plane Semiconductor Lasers: from Ultraviolet to Midinfrared; (1997) https://doi.org/10.1117/12.273804
Event: Photonics West '97, 1997, San Jose, CA, United States

Abstract

We present a near-field optical beam induced current study of aged high power laser diode arrays (LDA). A near-field scanning optical microscope was used as a light source for creating a photocurrent or a photovoltage in the LDA. Mechanisms generating the signal as well as methodical aspects such as resolution limits and application fields of the technique are discussed. The method is demonstrated to provide insight into the microscopic aging properties of LDAs. Both monitoring of the aging status as well as the localization of defects becomes possible.

Citation Download Citation

Jens Wolfgang Tomm, Alexander Richter, Christoph Lienau, Thomas Elsaesser, and Johann Luft "Near-field optical-beam-induced current spectroscopy as a tool for analyzing aging processes in diode lasers", Proc. SPIE 3001, In-Plane Semiconductor Lasers: from Ultraviolet to Midinfrared, (2 May 1997); https://doi.org/10.1117/12.273804

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