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Proceedings Article

High-accuracy x-ray foil optic assembly

[+] Author Affiliations
Glen P. Monnelly, Olivier Mongrard, David Breslau, Nat Butler, Carl G. Chen, Wendy Gu, Ralf K. Heilmann, Paul T. Konkola, George R. Ricker, Jr., Mark L. Schattenburg

Massachusetts Institute of Technology (USA)

Lester M. Cohen

Smithsonian Astrophysical Observatory (USA)

Proc. SPIE 4138, X-Ray Optics, Instruments, and Missions IV, 164 (November 28, 2000); doi:10.1117/12.407556
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From Conference Volume 4138

  • X-Ray Optics, Instruments, and Missions IV
  • Richard B. Hoover; Arthur B. C. Walker II
  • San Diego, CA, USA | July 30, 2000

abstract

Achieving arcsecond angular resolution in a grazing-incidence foil optic X-ray telescope, such as the segmented mirror approach being considered for the Constellation-X Spectroscopy X-Ray Telescope (SXT), requires accurate placement of individual foils. We have developed a method for mounting large numbers of nested, segmented foil optics with sub- micrometer accuracy using lithographically defined and etched silicon alignment micro-structures. A system of assembly tooling, incorporating the silicon micro-structures, is used to position the foils which are then bonded to a flight structure. The advantage of this procedure is that the flight structure has relaxed tolerance requirements while the high accuracy assembly tooling can be reused. A companion paper by Bergner et al. discusses how our process could be used for the SXT. We have built an assembly truss with a simplified rectilinear geometry designed to experimentally test this alignment and mounting technique. We report results of tests with this system that demonstrate its ability to provide sub- micrometer alignment of rigid test optics.

© (2000) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Glen P. Monnelly ; Olivier Mongrard ; David Breslau ; Nat Butler ; Carl G. Chen, et al.
"High-accuracy x-ray foil optic assembly", Proc. SPIE 4138, X-Ray Optics, Instruments, and Missions IV, 164 (November 28, 2000); doi:10.1117/12.407556; http://dx.doi.org/10.1117/12.407556


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