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Proceedings Article

Focusing coherent x-rays with refractive optics

[+] Author Affiliations
Richard H. Pantell, Joseph Feinstein

Stanford Univ. (USA)

H. R. Beguiristain, Melvin A. Piestrup, Charles K. Gary, J. Theodore Cremer

Adelphi Technology Inc. (USA)

Proc. SPIE 4143, X-Ray FEL Optics and Instrumentation, 109 (January 25, 2001); doi:10.1117/12.413686
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From Conference Volume 4143

  • X-Ray FEL Optics and Instrumentation
  • Dennis M. Mills; Horst Schulte-Schrepping; John R. Arthur
  • San Diego, CA, USA | July 30, 2000

abstract

Refractive lenses have been used successfully to focus incoherent x-ray emission in the wavelength range from 2 to .5A with focal lengths on the order of one meter. A stack of N lens elements is employed to reduce the focal length by the factor N over a single element, and such a lens is terms a Compound Refractive Lens (CRL). Contrary to intuition, misalignment of parabolic lens elements doesn't alter the focusing properties and results in only a small reduction in transmission. Coherent x-ray sources are being developed with wavelengths of 1-1.5A and source diameters of 50- 80micrometers , and the CRL is ideally suited to produce a small, intense image. Chromatic aberration increase the size of the image and so it is important to provide chromatic correction to minimize the image dimensions. Pulse broadening due to the dispersion of the lens material is negligible. Intensity gain is in the range from 105 to 10+$6), where gain is defined as the intensity ratio in an image plane with and without the lens in place. Maximum image intensity is obtained when the CRL is placed a distance of 100 to 200 m from the source, and the typical diameter of the focused spot is about one micron.

© (2001) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Richard H. Pantell ; Joseph Feinstein ; H. R. Beguiristain ; Melvin A. Piestrup ; Charles K. Gary, et al.
"Focusing coherent x-rays with refractive optics", Proc. SPIE 4143, X-Ray FEL Optics and Instrumentation, 109 (January 25, 2001); doi:10.1117/12.413686; http://dx.doi.org/10.1117/12.413686


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