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Proceedings Article

Monochromator for the synchrotron radiation beamline X-MOSS at ELETTRA

[+] Author Affiliations
Giampiero Naletto, Giuseppe Tondello

Univ. di Padova (Italy) and Instituto Nazionale per la Fisica della Materia (Italy)

Maria-Guglielmina Pelizzo

Univ. di Padova (Italy) and Univ. of California/Berkeley (Italy)

Stefano Nannarone

Univ. di Modena and Instituto Nazionale per la Fisica della Materia (Italy)

Angelo Giglia

Lab. TASC/Instituto Nazionale per la Fisica della Materia (Italy)

Proc. SPIE 4145, Advances in X-Ray Optics, 105 (January 5, 2001); doi:10.1117/12.411626
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From Conference Volume 4145

  • Advances in X-Ray Optics
  • Andreas K. Freund; Tetsuya Ishikawa; Ali M. Khounsary; Derrick C. Mancini; Alan G. Michette; Sebastian Oestreich
  • San Diego, CA, USA | July 30, 2000

abstract

The optical configuration of the monochromator for the new beamline X-MOSS at the ELETTRA synchrotron ring is described. The requirements for this instrument are to collect a 3 mrad X 2 mrad aperture beam produced by a bending magnet in the 3 - 1400 eV energy range; the energy resolution has to be 3000 or better over the whole range, with a focused beam of the order of 10 - 50 micrometer. The designed monochromator, presently under construction, is a slitless four grazing incidence optical elements: the first element is a one-meter paraboloidal mirror in sagittal focusing, then there is a plane mirror-plane grating dispersion system and finally a second one-meter paraboloidal mirror, also used in sagittal focusing. The latter focuses the radiation on the monochromator exit slit. This monochromator design is not limited by a defined working curve: in this way it is possible to select the preferred operational parameters, to optimize either the flux or the resolution or the high order rejection. The monochromatic beam is finally sent on the sample under examination by an ellipsoidal refocusing mirror.

© (2001) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Giampiero Naletto ; Maria-Guglielmina Pelizzo ; Giuseppe Tondello ; Stefano Nannarone and Angelo Giglia
"Monochromator for the synchrotron radiation beamline X-MOSS at ELETTRA", Proc. SPIE 4145, Advances in X-Ray Optics, 105 (January 5, 2001); doi:10.1117/12.411626; http://dx.doi.org/10.1117/12.411626


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