Diffusion equation and its application to SMD inspection

Bingcheng Li; Jesus Rene Villalobos; Jose Mario Gallegos; Sergio D. Cabrera

doi:10.1117/12.271238

15 April 1997 Diffusion equation and its application to SMD inspection

Bingcheng Li, Jesus Rene Villalobos, Jose Mario Gallegos, Sergio D. Cabrera

Proceedings Volume 3029, Machine Vision Applications in Industrial Inspection V; (1997) https://doi.org/10.1117/12.271238
Event: Electronic Imaging '97, 1997, San Jose, CA, United States

Abstract

The diffusion equation has received increasing attention in the fields of image analysis and computer vision for tasks such as image smoothing, image enhancement, feature extraction as well as dominant point detection. In this paper, the diffusion equation is applied to the inspection of surface mounted devices. It is shown experimentally that diffusion-equation-based methods could render very good discriminating features. The inspection experiments show that the correct inspection rate of the diffusion-equation- based method is very high for both training boards and test boards.

Citation Download Citation

Bingcheng Li, Jesus Rene Villalobos, Jose Mario Gallegos, and Sergio D. Cabrera "Diffusion equation and its application to SMD inspection", Proc. SPIE 3029, Machine Vision Applications in Industrial Inspection V, (15 April 1997); https://doi.org/10.1117/12.271238

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