Paper
15 May 2000 Multiresolution scanning imager with spatially uniform noise response based on a new class of Hadamard masks
Author Affiliations +
Abstract
In spite the prodigious growth in the market for digital cameras, they have yet to displace film-based cameras in the consumer market. This is largely due to the high cost of photographic resolution sensors. One possible approach to producing a low cost, high resolution sensor is to linearly scan a masked low resolution sensor. Masking of the sensor elements allows transform domain imaging. Multiple displaced exposures of such a masked sensor permits the device to acquire a linear transform of a higher resolution representation of the image than that defined by the sensor element dimensions. Various approaches have been developed in the past along these lines, but they often suffer from poor sensitivity, difficulty in being adapted to a 2D sensor or spatially variable noise response. This paper presents an approach based on a new class of Hadamard masks--Uniform Noise Hadamard Masks--which has superior sensitivity to simple sampling approaches and retains the multiresolution capabilities of certain Hadamard matrices, while overcoming the non-uniform noise response problems of some simple Hadamard based masks.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Donald J. Bone and Dan C. Popescu "Multiresolution scanning imager with spatially uniform noise response based on a new class of Hadamard masks", Proc. SPIE 3965, Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications, (15 May 2000); https://doi.org/10.1117/12.385462
Lens.org Logo
CITATIONS
Cited by 1 patent.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Sensors

Image resolution

Imaging systems

Chemical elements

Matrices

Image sensors

Cameras

RELATED CONTENT

To zoom or not to zoom do we have...
Proceedings of SPIE (September 03 2015)
Lens evaluation for electronic photography
Proceedings of SPIE (June 01 1991)
Low-Contrast Imaging
Proceedings of SPIE (August 08 1977)

Back to Top