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Proceedings Article

Ellipsometric studies of photochromic ultrathin polymer films

[+] Author Affiliations
Harald Knobloch, S. Katholy, Horst Orendi, J. Hesse, Dietrich Prescher, Ludwig Brehmer

Univ. Potsdam (Germany)

Ralf Ruhmann

Institut fuer Angewandte Chemie eV (Germany)

Proc. SPIE 3094, Polarimetry and Ellipsometry, 276 (April 1, 1997); doi:10.1117/12.271826
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From Conference Volume 3094

  • Polarimetry and Ellipsometry
  • Maksymilian Pluta; Tomasz R. Wolinski
  • Kazimierz Dolny, Poland | May 20, 1996

abstract

We present ellipsometric measurements on Langmuir-Blodgett monolayer assemblies of photochromic polymers; the polymer we used was a statistical copolymer with polymethacrylate mainchains and azobenzene sidegroups. Ellipsometry gives a value of n equals 1.557 for the refractive index and a film thickness of 1.58 nm per monolayer. When exposed to light of appropriate wavelength, the azobenzene groups undergo a trans (reversible reaction) cis photoisomerization process which was monitored by ellipsometry. We found an average change in film thickness of 0.02 nm per monolayer during the trans(reversible reaction)cis transition process, whereas the data obtained do not show any significant change in refractive index.

© (1997) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Harald Knobloch ; S. Katholy ; Horst Orendi ; J. Hesse ; Dietrich Prescher, et al.
"Ellipsometric studies of photochromic ultrathin polymer films", Proc. SPIE 3094, Polarimetry and Ellipsometry, 276 (April 1, 1997); doi:10.1117/12.271826; http://dx.doi.org/10.1117/12.271826


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