Paper
17 September 1997 Comparison of the moire two-beam phase-stepping and Fourier transform method techniques in Fizeau interferometry
Benito Vasquez Dorrio, Jose Carlos Lopez Vazquez, Jose M. Alen, J. Bugarin, Antonio Fernandez, Angel F. Doval, Jesus Blanco-Garcia, Mariano Perez-Amor, J. L. Fernandez
Author Affiliations +
Proceedings Volume 3098, Optical Inspection and Micromeasurements II; (1997) https://doi.org/10.1117/12.281167
Event: Lasers and Optics in Manufacturing III, 1997, Munich, Germany
Abstract
We have previously proposed a phase evaluation method of multiple-beam Fizeau patterns that combines the two-beam phase-stepping algorithms with the more effect. This method is based on a multiplicative moire image formation process obtained y the direct superposition of high-frequency multiple-beam Fizeau carrier fringes on a transmission grating. In this paper the contrast between this Moire two- beam phase-stepping technique and the direct evaluation of the high-frequency multiple-beam Fizeau carrier fringes by means of the Fourier Transform Method is presented.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Benito Vasquez Dorrio, Jose Carlos Lopez Vazquez, Jose M. Alen, J. Bugarin, Antonio Fernandez, Angel F. Doval, Jesus Blanco-Garcia, Mariano Perez-Amor, and J. L. Fernandez "Comparison of the moire two-beam phase-stepping and Fourier transform method techniques in Fizeau interferometry", Proc. SPIE 3098, Optical Inspection and Micromeasurements II, (17 September 1997); https://doi.org/10.1117/12.281167
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KEYWORDS
Moire patterns

Fourier transforms

Image processing

Fringe analysis

Interferometers

Interferometry

Linear filtering

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