Paper
1 October 1997 Metrology for spatial interferometry IV
Author Affiliations +
Abstract
The proposed Space Interferometry Mission (SIM) spacecraft carries high resolution stellar interferometers for micro-arc- second accuracy astrometric measurements. These stellar interferometers require picometer accuracy one dimensional metrology gauges, surface metrology gauges and 3-dimensional metrology gauges. The absolute metrology gauges required by these interferometers can be considerably less accurate due to the careful design of the astrometric interferometers on the spacecraft. Open-faced, hollow corner cube retro-reflectors are used as fiducials in the one-dimensional relative and absolute metrology gauges and the 3-dimensional metrology gauge. The diffraction caused by the assembly and the component defects of these hollow retro-reflectors affects the accuracy of these metrology gauges. A simulation quantifying some of the effects of the component and assembly defects of hollow retro-reflectors on the accuracy of a picometer linear metrology gauge is presented. An auto-aligning, 3-dimensional metrology gauge constructed using the sub-picometer linear metrology gauges was described in earlier papers. The functioning automatic alignment and the sub-nanometer, in-air tracking results from this 3-dimensional metrology gauge are presented.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yekta Gursel "Metrology for spatial interferometry IV", Proc. SPIE 3116, Small Spacecraft, Space Environments, and Instrumentation Technologies, (1 October 1997); https://doi.org/10.1117/12.293333
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Cited by 3 scholarly publications.
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KEYWORDS
Metrology

Head

Motion measurement

Retroreflectors

Ferroelectric materials

Diffraction

Polarization

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