Scattering from coated random rough surfaces characterized by the Mueller matrix

Yuzhi Zhang; Ezekiel Bahar

doi:10.1117/12.278964

3 October 1997 Scattering from coated random rough surfaces characterized by the Mueller matrix

Yuzhi Zhang, Ezekiel Bahar

Proceedings Volume 3121, Polarization: Measurement, Analysis, and Remote Sensing; (1997) https://doi.org/10.1117/12.278964
Event: Optical Science, Engineering and Instrumentation '97, 1997, San Diego, CA, United States

Abstract

The Mueller matrix completely characterizes scattered electromagnetic waves. It relates the incident to the scattered Stokes vectors. The Mueller matrix which contains intensity and relative phase data is very useful for remote sensing. The Mueller matrix , characterizing scattering from uniformly coated 2D random rough surfaces are assumed to be homogeneous, and isotropic with a Gaussian surface height joint probability density function. The diffuse, incoherent and coherent contributions to the Mueller matrix elements are evaluated. The Mueller matrix elements are more sensitive to the changes in the rms slope than to changes in the rms height. The element M₃₄ equals M₄₃ is most sensitive to variations in the thickness of the coating layer. This result could be used to estimate the thickness of the coating material. The magnitudes of the Mueller matrix elements are considerably more sensitive to changes in dissipation in the coating material than to changes in dissipation of the substrate.

Citation Download Citation

Yuzhi Zhang and Ezekiel Bahar "Scattering from coated random rough surfaces characterized by the Mueller matrix", Proc. SPIE 3121, Polarization: Measurement, Analysis, and Remote Sensing, (3 October 1997); https://doi.org/10.1117/12.278964

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