Paper
9 December 1997 Fast modular RLE-based inspection scheme for PCBs
Fikret Ercal, Filiz Bunyak, Feng Hao, Lei Zheng
Author Affiliations +
Proceedings Volume 3203, Architectures, Networks, and Intelligent Systems for Manufacturing Integration; (1997) https://doi.org/10.1117/12.294439
Event: Intelligent Systems and Advanced Manufacturing, 1997, Pittsburgh, PA, United States
Abstract
On-line inspection of PCBs requires acquisition and processing of gigabytes of image data in a matter of few seconds, especially when multi-layer and very high-resolution boards are used. To meet the demands for speed and accuracy, our inspection system uses run-length encoding (RLE) for storage and operations and an inspection scheme which exploits the availability of an artwork for comparison purposes. The system which is suitable for parallel processing consists of four parts: (1) segmentation of artwork and feature extraction, (2) image acquisition, (3) inspection of blank areas, and (4) inspection of trace areas. First, the artwork which is available as a CAD file in Gerber format, is segmented offline into primitive patterns and information related to the location and identification of each segment is stored in a large image database to be used later for real-time inspection. A time- and space-efficient technique based on RLE is used for storage of essential features and image operations.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Fikret Ercal, Filiz Bunyak, Feng Hao, and Lei Zheng "Fast modular RLE-based inspection scheme for PCBs", Proc. SPIE 3203, Architectures, Networks, and Intelligent Systems for Manufacturing Integration, (9 December 1997); https://doi.org/10.1117/12.294439
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Cited by 10 scholarly publications.
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KEYWORDS
Inspection

Image segmentation

Image processing

Computer aided design

Image storage

Algorithm development

Computer programming

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