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Proceedings Article

Microscopy using an interference pattern as illumination source

[+] Author Affiliations
Rimas Juskaitis, Mark A. A. Neil, Tony Wilson

Univ. of Oxford (United Kingdom)

Proc. SPIE 3261, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing V, 27 (June 9, 1998); doi:10.1117/12.310568
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From Conference Volume 3261

  • Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing V
  • Carol J. Cogswell; Jose-Angel Conchello; Jeremy M. Lerner; Thomas T. Lu; Tony Wilson
  • San Jose, CA | January 27, 1998

abstract

We describe a method of obtaining optically scanned fluorescence images in a widefield conventional microscope by interfering two beams on an object so as to illuminate it with a single spatial frequency fringe pattern. Images taken at three spatial positions of the fringe pattern are processed in real time to produce optically sectioned images which are substantially similar to those obtained with confocal microscopes.

© (1998) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Rimas Juskaitis ; Mark A. A. Neil and Tony Wilson
"Microscopy using an interference pattern as illumination source", Proc. SPIE 3261, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing V, 27 (June 9, 1998); doi:10.1117/12.310568; http://dx.doi.org/10.1117/12.310568


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