High-resolving x-ray spectrographs for laser-generated plasmas

Eckhart Foerster; T. Missalla; Ingo Uschmann; Josef Heinisch; Oldrich Renner; M. Kopecky; E. Krousky; Justin S. Wark

doi:10.1117/12.167994

1 February 1994 High-resolving x-ray spectrographs for laser-generated plasmas

Eckhart Foerster, T. Missalla, Ingo Uschmann, Josef Heinisch, Oldrich Renner, M. Kopecky, E. Krousky, Justin S. Wark

Proceedings Volume 2015, Applications of Laser Plasma Radiation; (1994) https://doi.org/10.1117/12.167994
Event: SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation, 1993, San Diego, CA, United States

Abstract

X-ray spectroscopy of laser-generated plasmas has been performed by using two non- conventional variants of the double-crystal spectrometer and the Johann spectrometer. They provide a very high spectral resolution in a limited spectral range that covers, for example, the range of a resonance line and its satellites. The excellent luminosity of the vertical variant of the Johann spectrometer makes its application very attractive, in spite of the need for exact testing and alignment.

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Eckhart Foerster, T. Missalla, Ingo Uschmann, Josef Heinisch, Oldrich Renner, M. Kopecky, E. Krousky, and Justin S. Wark "High-resolving x-ray spectrographs for laser-generated plasmas", Proc. SPIE 2015, Applications of Laser Plasma Radiation, (1 February 1994); https://doi.org/10.1117/12.167994

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