Characterization of a color-sensitive photodetector implemented in a BiCMOS technology

Mohamed Ben Chouikha; Francoise Vienot; Guo Neng Lu

doi:10.1117/12.298281

2 January 1998 Characterization of a color-sensitive photodetector implemented in a BiCMOS technology

Mohamed Ben Chouikha, Francoise Vienot, Guo Neng Lu

Proceedings Volume 3300, Color Imaging: Device-Independent Color, Color Hardcopy, and Graphic Arts III; (1998) https://doi.org/10.1117/12.298281
Event: Photonics West '98 Electronic Imaging, 1998, San Jose, CA, United States

Abstract

The operation and the colorimetric characterization of a buried triple p-n junction (BTJ) tristimulus detector are presented. A method defining a linear transformation between the detector color space and the C.I.E. standard is proposed. With the least squares fitting to the third order a mean color difference of 2.15 CIELAB units, between the detector response and the C.I.E. specification is predicted. The temperature effects on the detector and the linear transformation accuracy are studied between minus 60 degrees Celsius and 60 degrees Celsius. The color shifts in the detector specifications due to a temperature variations are smaller than 0.5.

Citation Download Citation

Mohamed Ben Chouikha, Francoise Vienot, and Guo Neng Lu "Characterization of a color-sensitive photodetector implemented in a BiCMOS technology", Proc. SPIE 3300, Color Imaging: Device-Independent Color, Color Hardcopy, and Graphic Arts III, (2 January 1998); https://doi.org/10.1117/12.298281

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