Paper
25 May 1998 Applications of x rays in art authentication: radiography, x-ray diffraction, and x-ray fluorescence
Richard Newman
Author Affiliations +
Proceedings Volume 3315, Scientific Detection of Fakery in Art; (1998) https://doi.org/10.1117/12.308590
Event: Photonics West '98 Electronic Imaging, 1998, San Jose, CA, United States
Abstract
Several techniques involving X-rays are routinely applied in the study of works of art. These include radiography, X-ray diffraction, and X-ray fluorescence (often coupled with an electron beam instrument such as a scanning electron microscope or microprobe). Radiography provides information on condition and previous restorations or repairs. In the case of sculptures, the technique also sheds light on the manufacturing process; in the case of paintings, otherwise invisible aspects of the painting technique are often revealed. X-ray diffraction is used primarily to provide specific identifications of crystalline inorganic materials, such as pigments, corrosion products, etc. Stand-alone X-ray fluorescence systems provide qualitative or quantitative information on elements in an object or sample. X-ray fluorescence in electron beam instruments provides general elemental composition information, and in some cases is used for quantitative analysis of a wide variety of inorganic materials, including metals, ceramics, glass, stone and paint samples. This analysis also provides microstructural information at the same time. All three procedure can provide important evidence when the authenticity of an artifact has been questioned.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Richard Newman "Applications of x rays in art authentication: radiography, x-ray diffraction, and x-ray fluorescence", Proc. SPIE 3315, Scientific Detection of Fakery in Art, (25 May 1998); https://doi.org/10.1117/12.308590
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KEYWORDS
Radiography

Statistical analysis

Ceramics

X-rays

Crystals

X-ray diffraction

X-ray fluorescence spectroscopy

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